Mfg Part Number: TS268EU | Manufacturer: Voron Electronics Corp | NSN : 6625-00-923-6534 |
Item Name : test set semiconduc | CAGE Code : 94518 |
Thank you for your interest in the Test Set Semiconduc parts we have in stock on Integrated Electronics Parts. This particular Voron Electronics Corp item is listed alongside the NSN 6625-00-923-6534 and part number TS268EU, allowing you to locate it quickly and easily. This item is currently in stock, so we encourage you to take advantage of our Instant RFQ service to acquire a competitive quote for NSN 6625-00-923-6534 and part number TS268EU. With team members on standby to answer any one of your questions, responses to quote requests or inquiries are completed in as little as 15 minutes.
Take your time to explore our ever-expanding catalogs and you will find that the NSN 6625-00-923-6534 can be found listed under CAGE Code 94518. However, we carry an array of other NSN all of which have been sourced from trusted distributors like Voron Electronics Corp. Get started with the procurement process by requesting a quote on part number TS268EU. Please include all of your part requirements and see how Integrated Electronics Parts can serve as your go-to sourcing solution. For additional questions, call or email us directly; we are ready to help you meet your operational deadlines however necessary.
MRC | Criteria | Characteristic |
---|---|---|
ABRY | Length | 8.187 INCHES NOMINAL |
MRC | Decoded Requirement | Clear Text Reply |
HGTH | Height | 3.625 INCHES NOMINAL |
AQXZ | Operating Test Capability | FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA |
ABGL | Width | 6.000 INCHES NOMINAL |
AQXY | Test Type For Which Designed | FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL |
ALSF | Internal Battery Accommodation | INCLUDED |
ANPZ | Inclosure Feature | SINGLE ITEM W/CARRYING CASE |
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